Chie-In Lee: search on Z-Library

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1

Low-power and high-linearity SiGe HBT low-noise amplifier using IM3 cancellation technique

Chie-In Lee, Wei-Cheng Lin, Ji-Min Lin

Journal:

Microelectronic Engineering

Year:

2012

Language:

english

File:

PDF, 995 KB

english, 2012

2

An Improved VBIC Large-Signal Equivalent-Circuit Model for SiGe HBT With an Inductive Breakdown Network by $X$ -Parameters

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2015

Language:

english

File:

PDF, 1.61 MB

english, 2015

3

A Simple and Accurate Pad-Thru-Short Deembedding Method Based on Systematic Analysis for RF Device Characterization

Lee, Chie-In, Lin, Wei-Cheng

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 1.59 MB

english, 2015

4

Investigation of Linearity in the High Electric Field Region for SiGe HBTs Based on Volterra Series

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 610 KB

english, 2014

5

SiGe HBT Large-Signal Table-Based Model With the Avalanche Breakdown Effect Considered

Lee, Chie-In, Lin, Yan-Ting, Su, Bo-Rung, Lin, Wei-Cheng

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 2.24 MB

english, 2015

6

An Improved Four-Port Equivalent Circuit Model of RF MOSFETs for Breakdown Operation

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 774 KB

english, 2015

7

MOSFET channel resistance characterization from the triode region to impact ionization region with the inductive breakdown network

Lee, Chie-In, Lin, Wei-Cheng

Journal:

Microelectronics Reliability

Year:

2015

Language:

english

File:

PDF, 984 KB

english, 2015

8

Three-port cascade de-embedding methodology with the dangling leg effect considered for pHEMT electron trapping characterization at microwave frequency

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Ting

Journal:

Microwave and Optical Technology Letters

Year:

2014

Language:

english

File:

PDF, 649 KB

english, 2014

9

Large-signal output characteristic investigation of the MOSFETs in the breakdown region based on X-parameters

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Ting

Journal:

Journal of Electromagnetic Waves

Year:

2015

Language:

english

File:

PDF, 353 KB

english, 2015

10

Investigation of geometry dependence on MOSFET linearity in the impact ionization region using Volterra series

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Ting

Journal:

Microelectronics Reliability

Year:

2015

Language:

english

File:

PDF, 1.32 MB

english, 2015

11

An Improved Noise Model for SiGe HBT with an Inductive Breakdown Network in the Avalanche Region

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 1.52 MB

english, 2015

12

Gate Length Dependence of Large-Signal Output Characteristics for the MOSFETs in the Breakdown Region Using X-Parameter Model

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Ting

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 959 KB

english, 2015

13

Improved artificial neural network RF noise model for MOSFETs operating in avalanche region

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Ting

Journal:

Electronics Letters

Year:

2016

Language:

english

File:

PDF, 391 KB

english, 2016

14

Large-Signal Characterization of pHEMT Under Different Load Conditions by Using X-Parameters

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

IEEE Microwave and Wireless Components Letters

Year:

2016

Language:

english

File:

PDF, 397 KB

english, 2016

15

Analysis of temperature dependence of linearity for SiGe HBTs in the avalanche region using Volterra series

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 314 KB

english, 2016

16

An Improved Millimeter-Wave General Cascade De-Embedding Method for 110 GHz On-Wafer Transistor Measurements

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Ting

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2017

Language:

english

File:

PDF, 453 KB

english, 2017

17

Investigation of Time-Domain Locus of SiGe HBTs in the Avalanche Region by Using the X-Parameter Measurement Under Large-Signal Drive

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

IEEE Microwave and Wireless Components Letters

Year:

2017

Language:

english

File:

PDF, 858 KB

english, 2017

18

A Novel p-i-n Inductor for Tunable Wideband Matching Network Application

Lee, Chie-In, Lin, Wei-Cheng

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 3.16 MB

english, 2013

19

A 2.4GHz high output power and high efficiency power amplifier operating at inductive breakdown in CMOS technology

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Ting

Journal:

Microelectronics Journal

Year:

2014

Language:

english

File:

PDF, 1.74 MB

english, 2014

20

A novel low-power transceiver topology for noncontact vital sign detection including the power management technique

Lee, Chie-In, Lin, Yan-Ting, Chen, Yu-Her, Lin, Wei-Cheng

Journal:

Microelectronics Journal

Year:

2013

Language:

english

File:

PDF, 3.74 MB

english, 2013

21

Modeling Inductive Behavior of MOSFET Scattering Parameter $S _{22}$ in the Breakdown Regime

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Tin

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2012

Language:

english

File:

PDF, 1.13 MB

english, 2012

22

Radio Frequency Current-Voltage Curve Including Breakdown Effect Implemented in Large Signal Model for Validation

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

IEEE Microwave and Wireless Components Letters

Year:

2014

Language:

english

File:

PDF, 501 KB

english, 2014

23

A New Method to Determine Avalanche Multiplication Factor Using Vector Network Analyzer for p-n Junctions

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Ting

Journal:

IEEE Microwave and Wireless Components Letters

Year:

2014

Language:

english

File:

PDF, 377 KB

english, 2014

24

Optical Transitions in a Self-Assembled Ge Quantum Dot/Si Superlattice Measured by Photoreflectance Spectroscopy

Lee, Chie-In, Lu, Yan-Ten, Su, Yan-Kuin, Chang, Shoou-Jinn, Hwang, Jenn-Shyong, Chang, Chung-Chih

Journal:

Japanese Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 2.50 MB

english, 2005

25

An Improved Cascade-Based Noise Deembedding Method for On-Wafer Noise Parameter Measurements

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Ting

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 607 KB

english, 2015

26

Investigation of RF Avalanche Inductive Effect on Reduction of Intermodulation Distortion of MOSFETs Using Volterra Series Analysis

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Tin, Yang, Bo-Siang

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2015

Language:

english

File:

PDF, 1.36 MB

english, 2015

27

Direct conversion Doppler radar vital sign detection system using power management technique

Lee, Chie-In, Lin, Yan-Ting, Chen, Jhih-Jie, Lin, Wei-Cheng

Journal:

Microwave and Optical Technology Letters

Year:

2014

Language:

english

File:

PDF, 891 KB

english, 2014

28

Temperature dependence on RF avalanche breakdown of RF mosfets in the impact ionization region

Lee, Chie-In, Lin, Wei-Cheng, Lin, Yan-Ting

Journal:

Microwave and Optical Technology Letters

Year:

2015

Language:

english

File:

PDF, 850 KB

english, 2015

29

Small-signal modeling for p-n junctions in the breakdown region at different temperatures using artificial neural networks

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

Journal of Electromagnetic Waves

Year:

2016

Language:

english

File:

PDF, 990 KB

english, 2016

30

An improved large-signal model by artificial neural network for the MOSFETs operating in the breakdown region

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

Journal of Electromagnetic Waves

Year:

2017

Language:

english

File:

PDF, 971 KB

english, 2017

31

Noise Parameter Analysis of SiGe HBTs for Different Sizes in the Breakdown Region

Lee, Chie-In, Lin, Yan-Ting, Lin, Wei-Cheng

Journal:

Active and Passive Electronic Components

Year:

2016

Language:

english

File:

PDF, 1.56 MB

english, 2016